PH51001: Experimental Methods
| PH51001 | |||||||||||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Course name | Experimental Methods | ||||||||||||||||||||||||||
| Offered by | Physics | ||||||||||||||||||||||||||
| Credits | 3 | ||||||||||||||||||||||||||
| L-T-P | 3-0-0 | ||||||||||||||||||||||||||
| Previous Year Grade Distribution | |||||||||||||||||||||||||||
| |||||||||||||||||||||||||||
| Semester | Autumn | ||||||||||||||||||||||||||
Syllabus
Syllabus mentioned in ERP
Bulk analytical techniques: spectroscopic techniques like Fourier Transform, laser, microwave, radio frequency, Raman, plasma and X-ray emission. Electron probe microanalysis (EPMA). Bulk structure related techniques like X-ray, electron and neutron diffraction- basic principles and examples. Electron and X-ray microscopic techniques. Advanced surface analytical techniques like X-ray photoelectron (XPS) and Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), Rutherford back scattering spectrometry (RBS). Surface structure and microscopic techniques like low and high energy electron diffraction (LEED and HEED), field emission microscopy (FEM), grazing incidence techniques for surface structure. Scanning probe microscopy and spectroscopy. Vacuum techniques.
Concepts taught in class
Student Opinion
How to Crack the Paper
Classroom resources
Additional Resources
Time Table
| Day | 8:00-8:55 am | 9:00-9:55 am | 10:00-10:55 am | 11:00-11:55 am | 12:00-12:55 pm | 2:00-2:55 pm | 3:00-3:55 pm | 4:00-4:55 pm | 5:00-5:55 pm | |
|---|---|---|---|---|---|---|---|---|---|---|
| Monday | ||||||||||
| Tuesday | ||||||||||
| Wednesday | C231 | |||||||||
| Thursday | C231 | |||||||||
| Friday | C231 |