CS60076: Advances In Digital And Mixed Signal Testing

CS60076
Course name	Advances In Digital And Mixed Signal Testing
Offered by	Computer Science & Engineering
Credits	3
L-T-P	3-0-0
Previous Year Grade Distribution
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Semester	Spring

Syllabus

Syllabus mentioned in ERP

Delay fault testing: path delay test, transition faults, delay test methodologies. IDDQ testing: basic concept, faults detected, test generation, limitations, IDDQ design for testability. Functional testing of arithmetic and regular arrays. Functional testing of microprocessors and microcontrollers. Sequential circuit testing: time frame expansion and simulation-based approaches to ATPG, design of testable FSMs, use of coding theory. Advanced BIST techniques: theory of linear machines, practical BIST architectures. System-on-chip design and test: SOC testing problem, core-based design and system wrapper, proposed test architectures for SOC, platform-based design and testability issues.DSP-based analog and mixed-signal test: functional DSP-based testing, static ADC and DAC testing methods, realizing emulated instruments, CODEC testing, future challenges. Model-based analog and mixed-signal test: analog fault models, levels of abstraction, analog fault simulation, analog ATPG. Analog test bus standard: analog circuit DFT, analog test bus, IEEE 1149.4 standard.References1.M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing, Kluwer Academic Publishers.2.A. Osseiran, Analog and mixedsignal boundary scan: a guide to the IEEE 1149.4 test standard, Kluwer Academic Publishers.3.A. Krstic and K-T. Cheng, Delay fault testing for VLSI circuits, Kluwer Academic Publishers.4.S. Chakravarty and P. J. Thadikaran, Introduction to IDDQ testing, Kluwer Academic Publishers.